发明名称 |
BONDING STRUCTURE FOR SEMICONDUCTOR PACKAGE AND METHOD
OF MANUFACTURING THE SAME |
摘要 |
The present disclosure relates to bonding structures useful in semiconductor packages and methods of manufacturing the same. In an embodiment, the bonding structure comprises a substrate, having a top surface and including at least one bonding pad, wherein each bonding pad is disposed adjacent to the top surface of the substrate and has a sloped surface; and a semiconductor element including at least one pillar, wherein each pillar is bonded to a portion of the sloped surface of a corresponding bonding pad, and a gap is formed between a sidewall of the pillar and the sloped surface of the corresponding bonding pad. |
申请公布号 |
US2016240503(A1) |
申请公布日期 |
2016.08.18 |
申请号 |
US201514622494 |
申请日期 |
2015.02.13 |
申请人 |
Advanced Semiconductor Engineering, Inc. |
发明人 |
Shu Min-Fong;TSENG Yi-Hsiu;CHEN Kuan-Neng;KUO Shu-Chiao |
分类号 |
H01L23/00;H01L23/31;H01L23/498 |
主分类号 |
H01L23/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A bonding structure, comprising:
a substrate, having a top surface and comprising at least one bonding pad, wherein the bonding pad is disposed adjacent to the top surface of the substrate and has a sloped surface; and a semiconductor element, comprising at least one pillar; wherein each pillar is bonded to a portion of the sloped surface of a corresponding one of the at least one bonding pad, and a gap is formed between a sidewall of the pillar and the sloped surface of the corresponding bonding pad; wherein the substrate further comprises a first insulation layer disposed on the top surface thereof and between the bonding pads, and the semiconductor element further comprises a second insulation layer between the pillars, wherein the first insulation layer contacts the second insulation layer. |
地址 |
Kaohsiung TW |