发明名称 X-ray apparatus for testing the physical characteristics of material
摘要 631,233. X-ray apparatus. STANDARD ELECTRONIC RESEARCH CORPORATION. Oct. 22, 1945, No. 10261/46. Convention date, Oct. 16, 1944. Divided out of 631,168. [Class 98 (i)] [Also in Groups XXXVIII and XL (b)] Fig. 1 shows a device for X-ray testing the thickness or density of a moving web, such as metal foil in which a metal housing 11 has a rectangular bore 18 through which the web 14 is fed. A cavity 20 within the housing contains a standard sample 15 of the web and beams of X-rays from a metal-shrouded tube 22 pass through slits 21, 23 through the standard sample and the web edge respectively and fall on photocells 12, 13, the output voltages of which are applied to amplifiers 25A, 25B operating separate output meters 28, 29 or a single differential meter. The respective amplifier outputs are related to the X-ray illuminations of the respective photocells, which depend on the degree of absorption of X-rays by the standard sample and by the web, so that the readings of the output meters enable the thickness of the web to be compared with that of the sample. If the thicknesses are equal the material densities may be compared. In a modification (Fig. 3, not shown), the X-ray device for testing the web is movable laterally across it so that examination is not confined to a fixed point thereon.
申请公布号 GB631233(A) 申请公布日期 1949.10.28
申请号 GB19480010261 申请日期 1945.10.22
申请人 STANDARD ELECTRONIC RESEARCH CORPORATION 发明人
分类号 B64C27/10;B64C27/18;B64C27/26;B64C27/28;B64D27/02;B64D39/00;F02K7/00;G01B15/00;G01N23/16 主分类号 B64C27/10
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