发明名称 SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes chips, wherein a first chip includes: an internal circuit (CKT1); first selectors (SELU1) to output signals from one of first outputs; second selectors to output signals from one of second outputs; first output buffer units (OBU1, OBU2, OBU3) to relay/interrupt signals output from one of the first outputs; second output buffer units to relay/interrupt signals output from one of the second outputs; first terminals (TM10a, TM12a, TM14a) to output a signal from the respective first output buffer units and belong to a first group in which the first terminals are placed at positions distant by first distances; and second terminals (TM13b, TM15b) to output a signal from the respective second output buffer units and belong to a second group in which the second terminals are placed at positions distant by second distances and each of the second terminals is placed at a position distant from an adjacent first terminal of the first terminals by third distances smaller than the first distances.
申请公布号 EP3029720(A1) 申请公布日期 2016.06.08
申请号 EP20150196545 申请日期 2015.11.26
申请人 FUJITSU LIMITED 发明人 OSHIYAMA, GEN;SHIKIBU, TAKAHIRO;MORIYAMA, OSAMU
分类号 H01L21/66;G01R31/3185;H01L25/065 主分类号 H01L21/66
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