发明名称 SEMICONDUCTOR CHIP MANUFACTURING CONDITION SETTING METHOD, AND MANUFACTURING METHOD AND MANUFACTURING SYSTEM OF SEMICONDUCTOR CHIP
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor chip manufacturing condition setting method and a manufacturing method and a manufacturing system of a semiconductor ship, which can inhibit breakage of a semiconductor chip.SOLUTION: A semiconductor chip manufacturing condition setting method is a manufacturing condition setting method in a semiconductor chip manufacturing method including a process of forming a surface side groove on a surface of a substrate and a process of forming from a rear face of the substrate by a rotating cutting member having a thickness larger than a width of an entry of the surface side groove, a rear face side groove which opens onto the surface side groove to divide the substrate into semiconductor chips, and comprises: a process of checking a width of the surface side groove; and a process of setting a manufacturing condition which influences a range where the center of a tip of the cutting member in a thickness direction varies so as to be included in the checked width.SELECTED DRAWING: Figure 19
申请公布号 JP2016096321(A) 申请公布日期 2016.05.26
申请号 JP20140237293 申请日期 2014.11.25
申请人 FUJI XEROX CO LTD 发明人 MINAMI TAKESHI;MURATA MICHIAKI;YAMAZAKI KENJI
分类号 H01L21/301 主分类号 H01L21/301
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