发明名称 |
ELECTROSTATIC DISCHARGE PROTECTION STRUCTURE CAPABLE OF PREVENTING LATCH-UP ISSUE CAUSED BY UNEXPECTED NOISE |
摘要 |
An electrostatic discharge protection structure comprises an isolation layer, a high voltage P-well, an N-well, a P-well, a first doped region of N-type conductivity, a second doped region of P-type conductivity, a third doped region of N-type conductivity, a fourth doped region of P-type conductivity, an anode, and a cathode. The isolation layer is disposed on a substrate. The high voltage P-well is disposed on the isolation layer. The N-well is disposed in the high voltage P-well. The P-well is disposed in the high voltage P-well, and the P-well is separated from the N-well. The first and the second doped regions are disposed in the N-well. The third and the fourth doped regions are disposed in the P-well. The anode is electrically connected to the first doped region and the second doped region, and the cathode is electrically connected to the fourth doped region. |
申请公布号 |
US2016118374(A1) |
申请公布日期 |
2016.04.28 |
申请号 |
US201614986741 |
申请日期 |
2016.01.04 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Chen Lu-An;Lin Ya-Ting;Tang Tien-Hao |
分类号 |
H01L27/02;H01L29/06;H01L29/87;H01L29/74 |
主分类号 |
H01L27/02 |
代理机构 |
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代理人 |
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主权项 |
1. An electrostatic discharge protection structure, comprising:
an isolation layer disposed on a substrate; a high voltage P-well disposed on the isolation layer; an N-well disposed in the high voltage P-well, wherein a doping concentration of the N-well is higher than a doping concentration of the high voltage P-well; a P-well disposed in the high voltage P-well, wherein a doping concentration of P-well is higher than the doping concentration of the high voltage P-well, and the P-well is separated from the N-well; a first doped region of N-type conductivity disposed in the N-well; a second doped region of P-type conductivity disposed in the N-well; a third doped region of N-type conductivity disposed in the P-well; a fourth doped region of P-type conductivity disposed in the P-well; a first electrode electrically connected to the first doped region and the second doped region; and a second electrode electrically connected to the fourth doped region but not directly electrically connected to the third doped region; wherein the third doped region and the fourth doped region form a diode with the third doped region being a cathode of the diode and the fourth doped region being an anode of the diode. |
地址 |
Hsin-Chu City TW |