发明名称 |
Three-dimensional semiconductor devices with current path selection structure |
摘要 |
Provided are three-dimensional semiconductor devices and methods of operating the same. The three-dimensional semiconductor devices may include active patterns arranged on a substrate to have a multi-layered and multi-column structure and drain patterns connected to respective columns of the active patterns. The methods may include a layer-selection step connecting a selected one of layers of the active patterns selectively to the drain patterns. For example, the layer-selection step may be performed in such a way that widths of depletion regions to be formed in end-portions of the active patterns are differently controlled depending on to a height from the substrate. |
申请公布号 |
US9299707(B2) |
申请公布日期 |
2016.03.29 |
申请号 |
US201414150452 |
申请日期 |
2014.01.08 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Jaeduk;Park Youngwoo;Park Jintaek;Lee Dohyun;Kanamori Kohji |
分类号 |
H01L27/108;H01L27/105;H01L27/115;G11C16/10;G11C16/14 |
主分类号 |
H01L27/108 |
代理机构 |
Myers Bigel & Sibley, P.A. |
代理人 |
Myers Bigel & Sibley, P.A. |
主权项 |
1. A three-dimensional semiconductor memory device, comprising:
a common source structure, a string selection structure, and a memory structure on a substrate, the memory structure interposed between the common source structure and the string selection structure, wherein the memory structure comprises a plurality of sequentially stacked active patterns elongated parallel to a top surface of the substrate and including first and second end-portions, gate patterns extending perpendicular to the top surface of the substrate, and memory elements interposed between the active patterns and the gate patterns, and wherein the string selection structure comprises:
drain patterns elongated perpendicular to the top surface of the substrate to connect the first end-portions of the active patterns to each other; andlayer-selection patterns sequentially stacked to control an energy band structure of respective ones of the first end-portions of the sequentially stacked active patterns located at a same level. |
地址 |
KR |