发明名称 |
Plasma pre-clean module and process |
摘要 |
A method for integrated circuit fabrication can include removing silicon oxide by a pre-clean process. The pre-clean process can include depositing a halogen-containing material on the surface of a substrate in a first reaction chamber, and transferring the substrate having the halogen-containing material to a second reaction chamber. Silicon oxide material can be removed from a surface of the substrate by sublimating the halogen-containing material in the second reaction chamber. A target material, such as a conductive material, may subsequently be deposited on the substrate surface in the second reaction chamber. |
申请公布号 |
US9299557(B2) |
申请公布日期 |
2016.03.29 |
申请号 |
US201414220001 |
申请日期 |
2014.03.19 |
申请人 |
ASM IP HOLDING B.V. |
发明人 |
Tolle John;Goodman Matthew G.;Vyne Robert Michael;Hill Eric R. |
分类号 |
H01L21/02;H01L21/3205;H01L21/324;H01L21/311 |
主分类号 |
H01L21/02 |
代理机构 |
Knobbe, Martens, Olson & Bear, LLP |
代理人 |
Knobbe, Martens, Olson & Bear, LLP |
主权项 |
1. A method for integrated circuit fabrication, the method comprising:
removing a silicon oxide material from a surface of a substrate, wherein removing the silicon oxide material comprises:
depositing a halogen-containing material on the surface of the substrate in a first reaction chamber;transferring the substrate having the halogen-containing material to a second reaction chamber; andsublimating the halogen-containing material in the second reaction chamber, wherein sublimating the halogen-containing material comprises exposing the halogen-containing material to a plasma generated by a remote plasma unit; and subsequently depositing a conductive material on the surface of the substrate in the second reaction chamber. |
地址 |
Almere NL |