发明名称 Plasma pre-clean module and process
摘要 A method for integrated circuit fabrication can include removing silicon oxide by a pre-clean process. The pre-clean process can include depositing a halogen-containing material on the surface of a substrate in a first reaction chamber, and transferring the substrate having the halogen-containing material to a second reaction chamber. Silicon oxide material can be removed from a surface of the substrate by sublimating the halogen-containing material in the second reaction chamber. A target material, such as a conductive material, may subsequently be deposited on the substrate surface in the second reaction chamber.
申请公布号 US9299557(B2) 申请公布日期 2016.03.29
申请号 US201414220001 申请日期 2014.03.19
申请人 ASM IP HOLDING B.V. 发明人 Tolle John;Goodman Matthew G.;Vyne Robert Michael;Hill Eric R.
分类号 H01L21/02;H01L21/3205;H01L21/324;H01L21/311 主分类号 H01L21/02
代理机构 Knobbe, Martens, Olson & Bear, LLP 代理人 Knobbe, Martens, Olson & Bear, LLP
主权项 1. A method for integrated circuit fabrication, the method comprising: removing a silicon oxide material from a surface of a substrate, wherein removing the silicon oxide material comprises: depositing a halogen-containing material on the surface of the substrate in a first reaction chamber;transferring the substrate having the halogen-containing material to a second reaction chamber; andsublimating the halogen-containing material in the second reaction chamber, wherein sublimating the halogen-containing material comprises exposing the halogen-containing material to a plasma generated by a remote plasma unit; and subsequently depositing a conductive material on the surface of the substrate in the second reaction chamber.
地址 Almere NL