发明名称 |
Method and apparatus for diagnosing status of parts in real time in plasma processing equipment |
摘要 |
Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current. |
申请公布号 |
US9279758(B2) |
申请公布日期 |
2016.03.08 |
申请号 |
US201213706612 |
申请日期 |
2012.12.06 |
申请人 |
LAM RESEARCH CORPORATION |
发明人 |
Patrick Roger |
分类号 |
G01N27/00;G01N17/00;G01N27/20 |
主分类号 |
G01N27/00 |
代理机构 |
Buchanan, Ingersoll & Rooney PC |
代理人 |
Buchanan, Ingersoll & Rooney PC |
主权项 |
1. A method of diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including conductive elements embedded therein, comprising:
coupling the conductive elements to a power supply so that a bias potential relative to the ground is applied to the conductive elements; exposing the consumable part to plasma erosion until one of the conductive elements draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current; wherein the conductive elements are electrically connected to each other in series by a conducting wire. |
地址 |
Fremont CA US |