发明名称 Method and apparatus for diagnosing status of parts in real time in plasma processing equipment
摘要 Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current.
申请公布号 US9279758(B2) 申请公布日期 2016.03.08
申请号 US201213706612 申请日期 2012.12.06
申请人 LAM RESEARCH CORPORATION 发明人 Patrick Roger
分类号 G01N27/00;G01N17/00;G01N27/20 主分类号 G01N27/00
代理机构 Buchanan, Ingersoll & Rooney PC 代理人 Buchanan, Ingersoll & Rooney PC
主权项 1. A method of diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including conductive elements embedded therein, comprising: coupling the conductive elements to a power supply so that a bias potential relative to the ground is applied to the conductive elements; exposing the consumable part to plasma erosion until one of the conductive elements draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current; wherein the conductive elements are electrically connected to each other in series by a conducting wire.
地址 Fremont CA US