发明名称 DEVICE AND METHOD FOR INSPECTING APPEARANCE OF TRANSPARENT SUBSTRATE
摘要 The present invention relates to a device and a method to inspect an appearance of a transparent substrate; and the present invention accurately detects a crack of a correction blank. To solve this problem, the correction blank (1) is mounted on a glass plate (2); green light is radiated as transmitted light; and red light which is out of the transmitted light is radiated from a lower side of the glass plate (2) on the glass plate (2) and the correction blank (1). Red light is radiated as reflection light from an upper side of the glass plate (2). A diffusion penetration image (30a) by the red light, a regular penetration image (30b) by the green light, and a diffusion reflection image (30c) by the blue light are generated by a photographing image (20). An image processing device (30) obtains a composed image (30d) by composing the diffusion penetration image (30a), the regular penetration image (30b), and the diffusion reflection image (30c). A crack part (1a) of the correction blank (1) is detected by the composed image (30d).
申请公布号 KR20160019365(A) 申请公布日期 2016.02.19
申请号 KR20150106617 申请日期 2015.07.28
申请人 TOKYO WELD CO., LTD. 发明人 AKIMOTO TAKAYUKI
分类号 G01N21/958;G01N21/88;G06T7/00 主分类号 G01N21/958
代理机构 代理人
主权项
地址
您可能感兴趣的专利