发明名称 |
MEASURING SYSTEM AND MEASURING METHOD |
摘要 |
A measuring system includes: a projecting section Q which is configured to project an image in a predetermined pattern as light within multiple regions of an object; an image capturing section A which is configured to capture the object including those multiple regions; and an arithmetic section G which is configured to calculate and output the degree of light propagated through those multiple regions of the object based on the object's image information that has been gotten by the image capturing section A. |
申请公布号 |
US2015029321(A1) |
申请公布日期 |
2015.01.29 |
申请号 |
US201414483734 |
申请日期 |
2014.09.11 |
申请人 |
Panasonic Corporation |
发明人 |
IMAMURA Norihiro;YAMAGATA Michihiro;NOGUCHI Yoshimitsu |
分类号 |
G01N21/59;G06K9/46;H04N5/232 |
主分类号 |
G01N21/59 |
代理机构 |
|
代理人 |
|
主权项 |
1. A measuring system comprising:
a projecting section which is configured to project an image in a predetermined pattern as light within multiple regions of an object; an image capturing section which is configured to capture the object including those multiple regions; and an arithmetic section which is configured to calculate and output the degree of light propagated through those multiple regions of the object based on the object's image information that has been gotten by the image capturing section. |
地址 |
Osaka JP |