发明名称 Replacement low-K spacer
摘要 A method includes providing a gate structure having a dummy gate, a first spacer along a side of the gate. The dummy gate and the spacer are removed to expose a gate dielectric. A second spacer is deposited on at least one side of a gate structure cavity and a top of the gate dielectric. A bottom portion of the second spacer is removed to expose the gate dielectric and the gate structure is wet cleaned.
申请公布号 US9159567(B1) 申请公布日期 2015.10.13
申请号 US201414259497 申请日期 2014.04.23
申请人 GLOBALFOUNDRIES INC. 发明人 Xiao Changyong;Wong Hoong Shing;Konduparthi Deepasree;Pal Rohit
分类号 H01L21/336;H01L21/28 主分类号 H01L21/336
代理机构 Heslin Rothenberg Farley & Mesiti P.C. 代理人 Heslin Rothenberg Farley & Mesiti P.C. ;Cardona, Esq. Victor A.
主权项 1. A method, comprising: providing a gate structure having a dummy gate, and a first spacer along a side of the dummy gate; removing the dummy gate and the first spacer to expose a gate dielectric;depositing a second spacer on at least one side of a gate structure cavity and a top of the gate dielectric;removing a bottom portion of the second spacer to expose the gate dielectric;wet cleaning the gate structure; andexerting stress on the gate structure after the depositing the second spacer and before the removing the bottom portion of the second spacer.
地址 Grand Cayman KY