发明名称 |
Replacement low-K spacer |
摘要 |
A method includes providing a gate structure having a dummy gate, a first spacer along a side of the gate. The dummy gate and the spacer are removed to expose a gate dielectric. A second spacer is deposited on at least one side of a gate structure cavity and a top of the gate dielectric. A bottom portion of the second spacer is removed to expose the gate dielectric and the gate structure is wet cleaned. |
申请公布号 |
US9159567(B1) |
申请公布日期 |
2015.10.13 |
申请号 |
US201414259497 |
申请日期 |
2014.04.23 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Xiao Changyong;Wong Hoong Shing;Konduparthi Deepasree;Pal Rohit |
分类号 |
H01L21/336;H01L21/28 |
主分类号 |
H01L21/336 |
代理机构 |
Heslin Rothenberg Farley & Mesiti P.C. |
代理人 |
Heslin Rothenberg Farley & Mesiti P.C. ;Cardona, Esq. Victor A. |
主权项 |
1. A method, comprising:
providing a gate structure having a dummy gate, and a first spacer along a side of the dummy gate;
removing the dummy gate and the first spacer to expose a gate dielectric;depositing a second spacer on at least one side of a gate structure cavity and a top of the gate dielectric;removing a bottom portion of the second spacer to expose the gate dielectric;wet cleaning the gate structure; andexerting stress on the gate structure after the depositing the second spacer and before the removing the bottom portion of the second spacer. |
地址 |
Grand Cayman KY |