| 摘要 |
PROBLEM TO BE SOLVED: To enable test contents to be changed even after production without restricting test contents in a built-in self test of a memory. SOLUTION: A register circuit 106 provided in the built-in self test circuit of the memory changes test contents by performing setting change of an address generating circuit 101, an input data generating circuit 102, a control signal generating circuit 103, and an expected value data generating circuit 104 based on test setting data td received from the outside. COPYRIGHT: (C)2007,JPO&INPIT
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