摘要 |
<p>To provide quartz-type glass for a microlithographic projection exposure apparatus, which contains at least 51 mass% of SiO<SUB>2</SUB> and which further contains at least one member selected from the group consisting of lanthanum, aluminum, hafnium, nitrogen, scandium, yttrium and zirconium. It is a material which is useful for an illumination system for a microlithographic projection exposure apparatus or as a projection object lens and has a refractive index at 248 nm larger than 1.508 of quartz glass and a refractive index at 193 nm larger than 1.560 of quartz glass and which can be small-sized.</p> |
申请人 |
ASAHI GLASS COMPANY, LIMITED;HAYASHI, HIDEAKI;KOIKE, AKIO;KAWATA, MITSUHIRO;SUGIMOTO, NAOKI;KIKUGAWA, SHINYA;YAMADA, KENJI |
发明人 |
HAYASHI, HIDEAKI;KOIKE, AKIO;KAWATA, MITSUHIRO;SUGIMOTO, NAOKI;KIKUGAWA, SHINYA;YAMADA, KENJI |