发明名称 ESD protection for high voltage applications
摘要 An electrostatic discharge (ESD) protection device includes a diode located in a substrate and an N-type metal oxide semiconductor (NMOS) device located in the substrate adjacent the diode, wherein both the diode and the NMOS are coupled to an input device, and at least a portion of the diode and at least a portion of the NMOS device collectively form an ESD protection device.
申请公布号 US7563653(B2) 申请公布日期 2009.07.21
申请号 US20080113803 申请日期 2008.05.01
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 LEE JIAN-HSING;CHANG DENG-SHUN
分类号 H01L21/332 主分类号 H01L21/332
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