| 发明名称 | Test board and test system | ||
| 摘要 | The test board includes at least one first interface configured to electrically connect the test board with a test controller, at least one second interface configured to electrically connect the test board with at least one electrical device to be tested, respectively. The test board further includes at least one electrical component, and a bus system electrically connected to the first interface and one or more of the second interface and the electrical component. | ||
| 申请公布号 | US9146277(B2) | 申请公布日期 | 2015.09.29 |
| 申请号 | US200812267187 | 申请日期 | 2008.11.07 |
| 申请人 | Infineon Technologies AG | 发明人 | Redlich Stefan;Schademann Niels;Schmidinghoff Uwe |
| 分类号 | G01R31/00;G01R31/319;G01R31/302;G01R21/12;G01R31/28 | 主分类号 | G01R31/00 |
| 代理机构 | Eschweiler & Associates, LLC | 代理人 | Eschweiler & Associates, LLC |
| 主权项 | 1. A test board, comprising: at least one first interface configured to electrically connect the test board with a test controller, wherein the at least one first interface is directly connected to the test controller; at least one second interface configured to electrically connect the test board with at least one electrical device to be tested, respectively; at least one electrical component; a bus system electrically connected to the at least one first interface and the at least one second interface and the at least one electrical component, wherein the bus system is directly connected to the at least one first interface; and wherein the bus system is configured to implement a bus protocol to address components connected with the bus system. | ||
| 地址 | Neubiberg DE | ||