发明名称 Heterogeneous Chip Integration with Low Loss Interconnection Through Adaptive Patterning
摘要 <p>Integrating a semiconductor component with a substrate through a low loss interconnection formed through adaptive patterning includes forming a cavity in the substrate, placing the semiconductor component therein, filling a gap between the semiconductor component and substrate with a fill of same or similar dielectric constant as that of the substrate and adaptively patterning a low loss interconnection on the fill and extending between the contacts of the semiconductor component and the electrical traces on the substrate. The contacts and leads are located and adjoined using an adaptive patterning technique that places and forms a low loss radio frequency transmission line that compensates for any misalignment between the semiconductor component contacts and the substrate leads.</p>
申请公布号 EP2608260(A3) 申请公布日期 2015.09.23
申请号 EP20120179960 申请日期 2012.08.09
申请人 RAYTHEON COMPANY 发明人 RAJENDRAN, S.;SANCHEZ, MONTE R.;ESHELMAN, SUSAN M.;GENTRY, DOUGLAS R.;HANFT, THOMAS A.
分类号 H01L23/538;H01L23/544 主分类号 H01L23/538
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