DEVICE FOR INSPECTING CONDUCTIVITY OF GRAPHENE AND METHOD THEREOF

摘要

The present invention relates to a device and a method for inspecting conductivity of graphene. According to the present invention, time for inspecting conductivity of graphene can be reduced as conductivity can be measured by accurately and rapidly detecting an oxidation area and a reduction area of the graphene using terahertz waves. In addition, if the oxidation area exists in the graphene, the oxidation area is irradiated with electromagnetic waves and then consequently reduced. Therefore, conductivity is increased and repair time can be minimized.