| 摘要 |
<p>There is described an apparatus for obtaining images of an element (50) to be inspected, comprising first acquisition means (1 1 ) and second screening means (22) which can be activated according to a first activation mode, and deactivated according to a first deactivation mode; second acquisition means (21 ) and first screening means (12) which can be activated according to a second activation mode, and deactivated according to a second deactivation mode; the first acquisition means (1 1 ), the first screening means (12), the second acquisition means (21 ) and the second screening means (22) aligned along a common optical axis (100); wherein said first activation and deactivation mode and said second activation and deactivation mode occur in a predetermined sequence in order to obtain images of the first side (51 ) and of the second side (52) of the element (50), wherein said first screening means (12) and said second screening means (22) include an optical device (17), respectively, in turn containing a plate-like body (13) provided with colorless and light-diffusing impurities, said impurities adapted to modify the optical path of an input light beam which crosses said plate-like body (13), said plate-like body (13) also operatively coupled to at least one LED (120, 121, 122, 123).</p> |
