PARTIAL CHIP AND SYSTEM HAVING THE SAME

摘要

The present invention relates to a partial chip, a system including the same and an operation method thereof, wherein the partial chip comprises: a memory cell array; and a signal control circuit generating data corresponding to the data to be outputted from a fail area of the memory cell array. The signal control circuit bypasses the data outputted from a pass area of the memory cell array to a data comparison circuit and sets all of the second data as one among logic high and logic low while the operation of parallel bit test (PBT) is being performed.