Repair system for repairing defect using E fuses and method of controlling the same

摘要

A system for repairing a plurality of semiconductor chips each comprising a data storage region including electric fuses connected to the data storage regions of the plurality of semiconductor chips, a defect determination unit configured to read the data of a chip that is actually accessed and the data of an idle chip in the data storage regions, compare the actually accessed and read data with the data of the idle chip, and detect a defect based on a result of the comparison, a storage unit configured to store the defective position of the defect according to a result of the defect determination unit, and a repair unit configured to repair the defect through an E fuse connected to the position of the defect using a reset signal.

主权项

1. A repair system for repairing a plurality of semiconductor chips each comprising a data storage region, the system comprising:
electric fuses connected to the data storage regions of the plurality of semiconductor chips; a defect determination unit configured to read data of a chip that is actually accessed and data of an idle chip in the data storage regions, compare the actually accessed and read data with the data of the idle chip, and detect a defect based on a result of the comparison; a storage unit configured to store a defective position of the defect according to a result of the defect determination unit; and a repair unit configured to repair the defect through an E fuse connected to the position of the defect using a reset signal, wherein the repair unit comprises a counter unit for counting a number of the reset signals and generating a rupture signal when the number of reset signals reaches a specific number.