发明名称 |
Semiconductor device |
摘要 |
A semiconductor device includes a field effect transistor that has a first nitride semiconductor layer and a second nitride semiconductor layer larger in bandgap than the first nitride semiconductor layer formed on a substrate in this order and a gate electrode, a source electrode, and a drain electrode, and uses two-dimensional electron gas formed at the interface between the first and second nitride semiconductor layers as the channel. The field effect transistor further has a p-type nitride semiconductor layer formed between the gate electrode and the drain electrode and electrically connected to the drain electrode. |
申请公布号 |
US9018634(B2) |
申请公布日期 |
2015.04.28 |
申请号 |
US201414165405 |
申请日期 |
2014.01.27 |
申请人 |
Panasonic Intellectual Property Management Co., Ltd. |
发明人 |
Tanaka Kenichiro;Ueda Tetsuzo |
分类号 |
H01L29/778;H01L29/417;H01L29/66;H01L29/20 |
主分类号 |
H01L29/778 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A semiconductor device comprising a field effect transistor, the transistor having a first nitride semiconductor layer formed on a substrate, a second nitride semiconductor layer larger in bandgap than the first nitride semiconductor layer formed on the first nitride semiconductor layer, a gate electrode formed on the second nitride semiconductor layer, and a source electrode and a drain electrode formed to sandwich the gate electrode each being in contact with at least the second nitride semiconductor layer, the transistor using two-dimensional electron gas formed at an interface between the first nitride semiconductor layer and the second nitride semiconductor layer as a channel,
wherein the field effect transistor further has a p-type nitride semiconductor layer formed on the second nitride semiconductor layer at a position between the gate electrode and the drain electrode and electrically connected to the drain electrode, and an n-type nitride semiconductor layer is formed between the p-type nitride semiconductor layer and the first nitride semiconductor layer. |
地址 |
Osaka JP |