发明名称 Semiconductor device
摘要 A semiconductor device includes a field effect transistor that has a first nitride semiconductor layer and a second nitride semiconductor layer larger in bandgap than the first nitride semiconductor layer formed on a substrate in this order and a gate electrode, a source electrode, and a drain electrode, and uses two-dimensional electron gas formed at the interface between the first and second nitride semiconductor layers as the channel. The field effect transistor further has a p-type nitride semiconductor layer formed between the gate electrode and the drain electrode and electrically connected to the drain electrode.
申请公布号 US9018634(B2) 申请公布日期 2015.04.28
申请号 US201414165405 申请日期 2014.01.27
申请人 Panasonic Intellectual Property Management Co., Ltd. 发明人 Tanaka Kenichiro;Ueda Tetsuzo
分类号 H01L29/778;H01L29/417;H01L29/66;H01L29/20 主分类号 H01L29/778
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A semiconductor device comprising a field effect transistor, the transistor having a first nitride semiconductor layer formed on a substrate, a second nitride semiconductor layer larger in bandgap than the first nitride semiconductor layer formed on the first nitride semiconductor layer, a gate electrode formed on the second nitride semiconductor layer, and a source electrode and a drain electrode formed to sandwich the gate electrode each being in contact with at least the second nitride semiconductor layer, the transistor using two-dimensional electron gas formed at an interface between the first nitride semiconductor layer and the second nitride semiconductor layer as a channel, wherein the field effect transistor further has a p-type nitride semiconductor layer formed on the second nitride semiconductor layer at a position between the gate electrode and the drain electrode and electrically connected to the drain electrode, and an n-type nitride semiconductor layer is formed between the p-type nitride semiconductor layer and the first nitride semiconductor layer.
地址 Osaka JP