| 摘要 |
<p>PROBLEM TO BE SOLVED: To reduce measurement errors caused by the probe tip loading of a DUT.SOLUTION: A de-embed probe 100 includes two input terminals 112 and 114 configured to connect to a DUT, a memory 110, a signal generator 102 configured to output a signal, a plurality of load components 116, a plurality of switches 106, and a controller 108. Each load component 116 is configured to provide a different load. A first switch of the plurality of switches 106 is associated with the signal generator 102 and the other switches of the plurality of switches 106 are each associated with one load component 106. The controller 108 is configured to control the plurality of switches 106 to connect combinations of the loads from the plurality of load components 116 and the signal from the signal generator 102 across the two input terminals 112 and 114.</p> |
