发明名称 ERROR CATCH RAM SUPPORT USING FAN-OUT/FAN-IN MATRIX
摘要 <p>In accordance with one embodiment of the invention, a method and apparatus are provided for obtaining test data from multiples devices under test. This could be accomplished in accordance with one embodiment by outputting from a testing device a test signal for input in parallel to at least two devices under test; inputting in parallel to the testing device at least two response signals, each response signal produced by one of the at least two devices under test; storing the response signals received in parallel in a storage device; and serially outputting the response signals from the storage device.</p>
申请公布号 KR101503555(B1) 申请公布日期 2015.03.17
申请号 KR20107006340 申请日期 2008.08.20
申请人 发明人
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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