发明名称 Semiconductor device comprising a buried poly resistor
摘要 An embedded or buried resistive structure may be formed by amorphizing a semiconductor material and subsequently re-crystallizing the same in a polycrystalline state, thereby providing a high degree of compatibility with conventional polycrystalline resistors, such as polysilicon resistors, while avoiding the deposition of a dedicated polycrystalline material. Hence, polycrystalline resistors may be advantageously combined with sophisticated transistor architectures based on non-silicon gate electrode materials, while also providing high performance of the resistors with respect to the parasitic capacitance.
申请公布号 US8962420(B2) 申请公布日期 2015.02.24
申请号 US200912553475 申请日期 2009.09.03
申请人 GLOBALFOUNDRIES Inc. 发明人 Kurz Andreas;Boschke Roman;Buller James;Wei Andy
分类号 H01L21/8234;H01L21/8244;H01L27/06;H01L21/84;H01L27/12;H01L49/02 主分类号 H01L21/8234
代理机构 Amerson Law Firm, PLLC 代理人 Amerson Law Firm, PLLC
主权项 1. A method of forming a resistive structure of a semiconductor device, the method comprising: forming an isolation structure in a semiconductor layer formed on a buried insulating layer, said isolation structure laterally defining a resistor region in said semiconductor layer; forming a transistor in and above a crystalline active region that is positioned in said semiconductor layer; after forming said isolation structure, forming an amorphized semiconductor material in said resistor region; after forming said amorphized semiconductor material in said resistor region, introducing a dopant species into said amorphized semiconductor material to adjust a specific resistance of said resistive structure, wherein said dopant species is introduced when forming drain and source regions of said transistor; and annealing said amorphized semiconductor material to form a polycrystalline semiconductor region.
地址 Grand Cayman KY