发明名称 |
Semiconductor device comprising a buried poly resistor |
摘要 |
An embedded or buried resistive structure may be formed by amorphizing a semiconductor material and subsequently re-crystallizing the same in a polycrystalline state, thereby providing a high degree of compatibility with conventional polycrystalline resistors, such as polysilicon resistors, while avoiding the deposition of a dedicated polycrystalline material. Hence, polycrystalline resistors may be advantageously combined with sophisticated transistor architectures based on non-silicon gate electrode materials, while also providing high performance of the resistors with respect to the parasitic capacitance. |
申请公布号 |
US8962420(B2) |
申请公布日期 |
2015.02.24 |
申请号 |
US200912553475 |
申请日期 |
2009.09.03 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Kurz Andreas;Boschke Roman;Buller James;Wei Andy |
分类号 |
H01L21/8234;H01L21/8244;H01L27/06;H01L21/84;H01L27/12;H01L49/02 |
主分类号 |
H01L21/8234 |
代理机构 |
Amerson Law Firm, PLLC |
代理人 |
Amerson Law Firm, PLLC |
主权项 |
1. A method of forming a resistive structure of a semiconductor device, the method comprising:
forming an isolation structure in a semiconductor layer formed on a buried insulating layer, said isolation structure laterally defining a resistor region in said semiconductor layer; forming a transistor in and above a crystalline active region that is positioned in said semiconductor layer; after forming said isolation structure, forming an amorphized semiconductor material in said resistor region; after forming said amorphized semiconductor material in said resistor region, introducing a dopant species into said amorphized semiconductor material to adjust a specific resistance of said resistive structure, wherein said dopant species is introduced when forming drain and source regions of said transistor; and annealing said amorphized semiconductor material to form a polycrystalline semiconductor region. |
地址 |
Grand Cayman KY |