Resistive probing tip system for logic analyzer probing system

摘要

The resistive probing tip system has one or more carriers and one or more electrical contact assemblies. Each carrier has opposing surfaces with a plurality of resistors engaging the carrier. Each of the plurality of resistors has opposing electrical contacts that are exposed at respective opposing surfaces of the carrier. Each electrical contact assembly has opposing surfaces with electrical contacts exposed at the opposing surfaces with each electrical contact exposed on one surface coupled to a corresponding electrical contact on the other opposing surface. The carrier(s) and the electrical contact assembly(s) selectively mate to and mate from one another with the electrical contacts exposed at the opposing surfaces the carrier(s) and the electrical contact assembly(s) contacting one another. The carrier(s) and/or the electrical contact assembly(s) may be selectively secured to either of a circuit board or a probe head.

主权项

1. A resistive probing tip system comprising:
at least a first carrier having opposing surfaces, said first carrier retaining a plurality of resistors with each resistor having opposing electrical contacts exposed at respective opposing surfaces of the first carrier; at least a first electrical contact assembly having opposing surfaces with electrical contacts exposed at the respective opposing surfaces with each electrical contact exposed at one opposing surface electrically coupled to a corresponding electrical contact exposed at the other opposing surface; the first carrier and the first electrical contact assembly selectively mating to and mating from each other with the electrical contacts exposed at one surface of the first carrier and the electrical contact exposed at one surface of the first electrical contact assembly contacting each other; and means for selectively securing at least one of the first carrier or the first electrical contact assembly to at least one of a circuit board or a probe head.