发明名称 Fin field effect transistors and methods for fabricating the same
摘要 The disclosure relates to a Fin field effect transistor (FinFET). An exemplary structure for a FinFET comprises a substrate comprising a top surface; a first fin and a second fin extending above the substrate top surface, wherein each of the fins has a top surface and sidewalls; an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; a first gate dielectric covering the top surface and sidewalls of the first fin having a first thickness and a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness; and a conductive gate strip traversing over both the first gate dielectric and second gate dielectric.
申请公布号 US8963257(B2) 申请公布日期 2015.02.24
申请号 US201113293732 申请日期 2011.11.10
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Wann Clement Hsingjen;Yeh Ling-Yen;Shih Chi-Yuan;Lin Yi-Tang;Chang Chih-Sheng
分类号 H01L27/088;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/66 主分类号 H01L27/088
代理机构 Lowe Hauptman & Ham, LLP 代理人 Lowe Hauptman & Ham, LLP
主权项 1. A Fin field effect transistor (FinFET) comprising: a substrate comprising a top surface; a first fin and a second fin extending above the substrate top surface, wherein the first fin has a top surface and sidewalls and the second fin has a top surface and sidewalls; an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; a first gate dielectric covering the top surface and sidewalls of the first fin having a first thickness t1, wherein the first gate dielectric is in direct contact with the first fin; a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness t2 less than the first thickness, wherein the second gate dielectric is in direct contact with the second fin; and a conductive gate strip traversing over both the first gate dielectric and the second gate dielectric.
地址 TW