发明名称 |
Fin field effect transistors and methods for fabricating the same |
摘要 |
The disclosure relates to a Fin field effect transistor (FinFET). An exemplary structure for a FinFET comprises a substrate comprising a top surface; a first fin and a second fin extending above the substrate top surface, wherein each of the fins has a top surface and sidewalls; an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; a first gate dielectric covering the top surface and sidewalls of the first fin having a first thickness and a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness less than the first thickness; and a conductive gate strip traversing over both the first gate dielectric and second gate dielectric. |
申请公布号 |
US8963257(B2) |
申请公布日期 |
2015.02.24 |
申请号 |
US201113293732 |
申请日期 |
2011.11.10 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Wann Clement Hsingjen;Yeh Ling-Yen;Shih Chi-Yuan;Lin Yi-Tang;Chang Chih-Sheng |
分类号 |
H01L27/088;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/66 |
主分类号 |
H01L27/088 |
代理机构 |
Lowe Hauptman & Ham, LLP |
代理人 |
Lowe Hauptman & Ham, LLP |
主权项 |
1. A Fin field effect transistor (FinFET) comprising:
a substrate comprising a top surface; a first fin and a second fin extending above the substrate top surface, wherein the first fin has a top surface and sidewalls and the second fin has a top surface and sidewalls; an insulation layer between the first and second fins extending part way up the fins from the substrate top surface; a first gate dielectric covering the top surface and sidewalls of the first fin having a first thickness t1, wherein the first gate dielectric is in direct contact with the first fin; a second gate dielectric covering the top surface and sidewalls of the second fin having a second thickness t2 less than the first thickness, wherein the second gate dielectric is in direct contact with the second fin; and a conductive gate strip traversing over both the first gate dielectric and the second gate dielectric. |
地址 |
TW |