| 发明名称 |
Apparatus and method for analyzing graphene and graphene boundary |
| 摘要 |
A method of analyzing graphene includes providing a first graphene structure including graphene having grains and grain boundaries, and a support portion for supporting the graphene, generating a second graphene structure by oxidizing the first graphene structure, and detecting a shape of the graphene. |
| 申请公布号 |
US8945937(B2) |
申请公布日期 |
2015.02.03 |
| 申请号 |
US201313904526 |
申请日期 |
2013.05.29 |
| 申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Young-hee;Han Gang-hee;Duong Dinh Loc |
| 分类号 |
G01N21/17;C01B31/04;G01B11/24 |
主分类号 |
G01N21/17 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of analyzing graphene, the method comprising:
providing a first graphene structure including,
graphene having grains and grain boundaries, anda support portion for supporting the graphene; generating a second graphene structure by oxidizing the first graphene structure; and detecting a shape of the graphene. |
| 地址 |
Gyeonggi-do KR |
