发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To lessen a base metal film of a wiring which forms a semiconductor integrated circuit device and a semiconductor substrate in contact resistance between them. CONSTITUTION:A silicide layer 12 which is made of combined material composed of the component atoms of a base metal film 10a and a semiconductor substrate 1 and epitaxial to the semiconductor substrate 1 is provided to a contact surface between the base metal film 10a of a wiring 10 which forms a semiconductor integrated circuit device and a semiconductor layer 5 located on the semiconductor substrate 1. |
申请公布号 |
JPH0661177(A) |
申请公布日期 |
1994.03.04 |
申请号 |
JP19920125157 |
申请日期 |
1992.05.19 |
申请人 |
HITACHI LTD;HITACHI MICOM SYST:KK |
发明人 |
SUZUKI MASAYASU;TAKEDA TOSHIFUMI;OKA YASUSHI;YOSHIDA YASUKO;HARUTA AKIRA |
分类号 |
H01L21/28;H01L21/3205;H01L21/336;H01L21/768;H01L23/52;H01L23/522;H01L29/43;H01L29/78;(IPC1-7):H01L21/28;H01L29/46;H01L21/90;H01L21/320;H01L29/784 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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