发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To lessen a base metal film of a wiring which forms a semiconductor integrated circuit device and a semiconductor substrate in contact resistance between them. CONSTITUTION:A silicide layer 12 which is made of combined material composed of the component atoms of a base metal film 10a and a semiconductor substrate 1 and epitaxial to the semiconductor substrate 1 is provided to a contact surface between the base metal film 10a of a wiring 10 which forms a semiconductor integrated circuit device and a semiconductor layer 5 located on the semiconductor substrate 1.
申请公布号 JPH0661177(A) 申请公布日期 1994.03.04
申请号 JP19920125157 申请日期 1992.05.19
申请人 HITACHI LTD;HITACHI MICOM SYST:KK 发明人 SUZUKI MASAYASU;TAKEDA TOSHIFUMI;OKA YASUSHI;YOSHIDA YASUKO;HARUTA AKIRA
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L21/768;H01L23/52;H01L23/522;H01L29/43;H01L29/78;(IPC1-7):H01L21/28;H01L29/46;H01L21/90;H01L21/320;H01L29/784 主分类号 H01L21/28
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