INTEGRATED CIRCUIT COMPRISING TEST CIRCUITRY FOR TESTING FAN-OUT PATHS OF A TEST CONTROL PRIMARY INPUT

摘要

An integrated circuit comprises a primary input adapted to receive a test control signal, a primary output, and logic circuits having inputs coupled to the primary input via respective fan-out paths of the primary input. The integrated circuit further includes first test circuitry configured for testing a designated portion of the integrated circuit in a first test mode of operation with the test control signal at a first logic value, and second test circuitry coupled between the inputs of the logic circuits and the primary output and configured for testing of the fan-out paths in a second test mode of operation in which the test control signal takes on both the first logic value and a second logic value associated with a functional mode of operation. The primary input, primary output, logic circuits and test circuitry may be associated with a particular circuit core of the integrated circuit.

主权项

1. An integrated circuit comprising:
a primary input adapted to receive a test control signal; a primary output; a plurality of logic circuits having inputs coupled to the primary input via respective fan-out paths of the primary input; first test circuitry configured for testing a designated portion of the integrated circuit in a first test mode of operation with the test control signal at a first logic value; and second test circuitry coupled between the inputs of the logic circuits and the primary output and configured for testing of the fan-out paths in a second test mode of operation in which the test control signal takes on both the first logic value and a second logic value associated with a functional mode of operation.