发明名称 Method for obtaining extreme selectivity of metal nitrides and metal oxides
摘要 Methods for etching metal nitrides and metal oxides include using ultradilute HF solutions and buffered, low-pH HF solutions containing a minimal amount of the hydrofluoric acid species H2F2. The etchant can be used to selectively remove metal nitride layers relative to doped or undoped oxides, tungsten, polysilicon, and titanium nitride. A method is provided for producing an isolated capacitor, which can be used in a dynamic random access memory cell array, on a substrate using sacrificial layers selectively removed to expose outer surfaces of the bottom electrode.
申请公布号 US8883591(B2) 申请公布日期 2014.11.11
申请号 US201313890160 申请日期 2013.05.08
申请人 Micron Technology, Inc. 发明人 Shea Kevin R.
分类号 H01L21/8234;H01L21/8244;H01L21/3213;H01L21/768;H01L21/311;H01L49/02;H01L27/108 主分类号 H01L21/8234
代理机构 Knobbe, Martens, Olson & Bear LLP 代理人 Knobbe, Martens, Olson & Bear LLP
主权项 1. A method of forming a conductor on a substrate, the method comprising: forming a recess on the substrate; lining the recess with a sacrificial material comprising metal nitride or metal oxide; forming a conductive material within the recess; and removing the sacrificial material with an etch solution comprising an aqueous hydrofluoric acid etchant, wherein a ratio of an etch rate of the sacrificial material in the etch solution to an etch rate of the conductive material in the etch solution is greater than about 500:1.
地址 Boise ID US