发明名称 |
Method for obtaining extreme selectivity of metal nitrides and metal oxides |
摘要 |
Methods for etching metal nitrides and metal oxides include using ultradilute HF solutions and buffered, low-pH HF solutions containing a minimal amount of the hydrofluoric acid species H2F2. The etchant can be used to selectively remove metal nitride layers relative to doped or undoped oxides, tungsten, polysilicon, and titanium nitride. A method is provided for producing an isolated capacitor, which can be used in a dynamic random access memory cell array, on a substrate using sacrificial layers selectively removed to expose outer surfaces of the bottom electrode. |
申请公布号 |
US8883591(B2) |
申请公布日期 |
2014.11.11 |
申请号 |
US201313890160 |
申请日期 |
2013.05.08 |
申请人 |
Micron Technology, Inc. |
发明人 |
Shea Kevin R. |
分类号 |
H01L21/8234;H01L21/8244;H01L21/3213;H01L21/768;H01L21/311;H01L49/02;H01L27/108 |
主分类号 |
H01L21/8234 |
代理机构 |
Knobbe, Martens, Olson & Bear LLP |
代理人 |
Knobbe, Martens, Olson & Bear LLP |
主权项 |
1. A method of forming a conductor on a substrate, the method comprising:
forming a recess on the substrate; lining the recess with a sacrificial material comprising metal nitride or metal oxide; forming a conductive material within the recess; and removing the sacrificial material with an etch solution comprising an aqueous hydrofluoric acid etchant, wherein a ratio of an etch rate of the sacrificial material in the etch solution to an etch rate of the conductive material in the etch solution is greater than about 500:1. |
地址 |
Boise ID US |