发明名称 Statistical analyzing method and statistical quality indicator for reliability improvement of a capacitive touch device
摘要 For a capacitive touch device having a capacitive touch sensor to be sensed to generate sensed values, a sensing apparatus and method statistically analyze the sensed values generated in a certain time period to evaluate the sensing quality thereof, discard the poor reliable sensed values, and re-sense the capacitive touch sensor to generate new sensed values, by which the resultant output signal will have improved reliability.
申请公布号 US8866794(B2) 申请公布日期 2014.10.21
申请号 US201213567284 申请日期 2012.08.06
申请人 Elan Microelectronics Corporation 发明人 Lin Chia-Hsing;Kuo Po-Hao;Tao Yi-Hsin
分类号 G06F3/045 主分类号 G06F3/045
代理机构 Muncy, Geissler, Olds & Lowe, P.C. 代理人 Muncy, Geissler, Olds & Lowe, P.C.
主权项 1. A reliability improved sensing apparatus for a capacitive touch device having a capacitive touch sensor, said sensing apparatus comprising: an excitation unit connected to said capacitive touch sensor and controlled to apply an excitation signal to said capacitive touch sensor; a sampling unit connected to said capacitive touch sensor and controlled to sample and convert sensing signals received from said capacitive touch sensor to generate sensed values; a control unit connected to said excitation unit and said sampling unit, operative to control said excitation unit and said sampling unit for timing control based on a sensing frequency; and a statistical quality indicator connected to said sampling unit and said control unit, performing statistical analysis to said sensed values in a statistic cycle for evaluating a sensing quality to determine to discard poorly reliable sensed values, wherein the statistical quality indicator determines whether each sensed value exceeds a defined reasonable range and counts a number of said sensed values outside the defined reasonable range in said statistic cycle, and triggers a redo signal for said control unit when said number is larger than a defined threshold.
地址 Hsinchu TW