发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>Provided are a semiconductor device and a method for fabricating the same. The semiconductor device comprises: a semiconductor substrate; a lower conductive pattern located on the semiconductor substrate; an interlayer insulating film which is located on the lower conductive pattern and has a through-hole partially exposing the lower conductive pattern; an upper conductive pattern located within the through-hole and electrically connected with the lower conductive pattern; side surface spacers located on a side surface of the upper conductive pattern; and an air gap located between the through-hole and the side surface spacers, and between the lower conductive pattern and the side surface spacers.</p>
申请公布号 KR20140111895(A) 申请公布日期 2014.09.22
申请号 KR20130026388 申请日期 2013.03.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, WOO JIN;AHN SANG HOON;CHOI, GIL HEYUN;HONG, JONG WON
分类号 H01L21/764;H01L21/28 主分类号 H01L21/764
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