| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an appearance inspection device and an appearance inspection method capable of teaching a linear pattern of an arbitrary shape as an inspection region by a simple teaching operation for an image obtained by imaging an inspection object.SOLUTION: An appearance inspection device 1100 includes: an image storage part 1110; a teaching part 1120; an inspection part 1130; and a teaching content storage part 1140. The teaching part 1120 obtains an image of an inspection object from the image storage part 1110 in a teaching step of an inspection, and teaches on a position of an inspection point, a relative position and a relative angle of an inspection area for the position of the inspection point, an inspection content, and determination conditions for the inspection, and the like based on the information input by an operator via an operation device 1200. The teaching content storage part 1140 stores a parameter set in the teaching part 1120 and the teaching content taught by the teaching part 1120. The inspection part 1130 performs the inspection according to the teaching content stored in the teaching content storage part 1140 in an execution step of the inspection.</p> |
