发明名称 Bulk acoustic wave resonator device e.g. thin film bulk acoustic resonator device, for ladder filter for e.g. laptops, has compensation layer including positive temperature coefficient for offsetting portion of negative coefficient
摘要 <p>The device e.g. thin film bulk acoustic wave resonator device (200), has a bottom electrode (220) placed on a substrate (110) over a cavity (115) or acoustic mirror. A piezoelectric layer (130) is formed on the electrode. A top electrode is placed on the piezoelectric layer. A temperature compensation feature or layer (227) defines positive temperature coefficient for offsetting a portion of negative temperature coefficient of the piezoelectric layer, where the bottom or top electrode comprises an integrated lateral feature to create cut-off frequency mismatch or acoustic impedance mismatch. The acoustic mirror is a Bragg mirror. The substrate is formed of semiconductor material e.g. silicon, gallium arsenide, indium phosphide, glass, sapphire and alumina.</p>
申请公布号 DE102014101805(A1) 申请公布日期 2014.08.28
申请号 DE201410101805 申请日期 2014.02.13
申请人 AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. 发明人 CHOY, JOHN;NIKKEL, PHIL;BURAK, DARIUSZ;GRANNEN, KEVIN J.
分类号 H03H9/17;H03H3/04 主分类号 H03H9/17
代理机构 代理人
主权项
地址