发明名称 Semiconductor Device and Method of Forming Insulating Layer in Notches Around Conductive TSV for Stress Relief
摘要 A semiconductor device has a plurality of conductive vias formed into a semiconductor wafer. A portion of the semiconductor wafer is removed so the conductive vias extend above a surface of the semiconductor wafer. A notch is formed in the semiconductor wafer around each of the conductive vias. The notch around the conductive vias can be formed by wet etching, dry etching, or LDA. A first insulating layer is formed over a surface of the semiconductor wafer and conductive vias and into the notch to provide stress relief between the conductive vias and semiconductor wafer. A portion of the first insulating layer is removed to expose the conductive vias. A first conductive layer and second insulating layer can be formed around the conductive vias. A second conductive layer can be formed over the conductive vias. The notch can extend into the second insulating layer.
申请公布号 US2014225279(A1) 申请公布日期 2014.08.14
申请号 US201414257850 申请日期 2014.04.21
申请人 STATS ChipPAC, Ltd. 发明人 Choi Won Kyoung;Yong Chang Bum;Ku Jae Hun
分类号 H01L23/48;H01L21/768 主分类号 H01L23/48
代理机构 代理人
主权项 1. A method of making a semiconductor device, comprising: providing a semiconductor die; forming a conductive via through the semiconductor die; removing a portion of the semiconductor die adjacent to the conductive via; and forming a first insulating layer over a surface of the semiconductor die and adjacent to the conductive via.
地址 Singapore SG