发明名称 MANAGEMENT DEVICE OF SEMICONDUCTOR DEVICE, AND MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a management device of a semiconductor device for facilitating management of a semiconductor device by providing micro identification information to a semiconductor chip, or the like, and to provide a microscope. ! SOLUTION: In this invention, a management device of a semiconductor device includes an arithmetic unit accessible to a storage medium for storing the finger print pattern information in association with at least one of the semiconductor manufacturing conditions, measurement conditions when measuring the semiconductor, measurement results when measuring the semiconductor, and chip information. The arithmetic unit refers to at least one of the semiconductor manufacturing conditions, measurement conditions, measurement results, and chip information, based on the input of the finger print pattern information. This invention also provides a microscope. ! COPYRIGHT: (C)2014,JPO&INPIT
申请公布号 JP2014146722(A) 申请公布日期 2014.08.14
申请号 JP20130014968 申请日期 2013.01.30
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KAWADA HIROKI ; SUZUKI MAKOTO
分类号 H01L21/02;H01L21/66 主分类号 H01L21/02
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