METHOD OF GENERATING HEIGHT INFORMATION IN CIRCUIT BOARD INSPECTION APPARATUS

摘要

A method of generating height information in a circuit board inspection apparatus, first, obtaining a first image corresponding to a first area and a second image corresponding to a second area with partially overlapped to the first area of a test board. Next, the first image and the second image are matched based on the overlapped area of the first and second area. Sequentially, a relative positional relationship of the first and second images is obtained from the result of matching. Sequentially, a combined grid image is generated by combining the first grid image and the second grid image based on the relative positioning relationship, wherein the first and second grid images are obtained by irradiating a grid patterned light toward a measurement object formed on the board inspection apparatus. Therefore, it is possible to generate an exact height information.

主权项

1. A method of generating height information in a circuit board inspection apparatus comprising:
capturing and obtaining a first image corresponding to a first area and a second image corresponding to a second area with partially overlapped to the first area of a test board; matching the first image and the second image based on the overlapped area of the first area and the second area; obtaining a relative positioning relationship between the first area and the second area by using the result of matching; and generating a combined height information by combining a first grid image and a second grid image based on the positioning relationship, wherein the first grid image and the second grid image are captured by irradiating a measurement object formed on the circuit board inspection apparatus with a grid patterned light.