发明名称 METAL OXIDE TFT WITH IMPROVED TEMPERATURE STABILITY
摘要 A metal oxide thin film transistor includes a metal oxide semiconductor channel with the metal oxide semiconductor having a conduction band with a first energy level. The transistor further includes a layer of passivation material covering at least a portion of the metal oxide semiconductor channel. The passivation material has a conduction band with a second energy level equal to, or less than 0.5 eV above the first energy level.
申请公布号 WO2014099590(A1) 申请公布日期 2014.06.26
申请号 WO2013US74607 申请日期 2013.12.12
申请人 CBRITE INC. 发明人 SHIEH, CHAN-LONG;FOONG, FATT;MUSOLF, JUERGEN;YU, GANG
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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