发明名称 WAFER LEVEL APPLIED THERMAL HEAT SINK
摘要 A process for forming a heat sink on a semiconductor package at the wafer level stage of manufacture is disclosed. A semiconductor component wafer, prior to separation into separate component packages, is covered on one side with a resin metal foil layer. The resin foil layer is patterned by laser ablation to define the heat sink locations, and then a thermal paste is applied over the patterned layer. The thermal conductive paste is hardened to form the heat sinks. The wafer can then be separated into packages.
申请公布号 KR20140070655(A) 申请公布日期 2014.06.10
申请号 KR20147011906 申请日期 2012.10.04
申请人 FLIPCHIP INTERNATIONAL, L.L.C 发明人 CLARK DAVID;TESSIER THEODORE G.
分类号 H01L23/36;H05K7/20 主分类号 H01L23/36
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