发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To manufacture and provide a highly reliable display device comprising a thin film transistor which has high aperture ratio and stable electric characteristics.SOLUTION: In a manufacturing method of a semiconductor device having a thin film transistor in which a semiconductor layer including a channel formation region is an oxide semiconductor film, heat treatment (heat treatment for dehydration or dehydrogenation) for improving purity of the oxide semiconductor film and reducing moisture and the like which are impurities is performed. Further, aperture ratio is improved by forming a gate electrode layer, a source electrode layer, and a drain electrode layer by using conductive films having light transmitting properties.</p>
申请公布号 JP2014102512(A) 申请公布日期 2014.06.05
申请号 JP20130268521 申请日期 2013.12.26
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;SAKAKURA MASAYUKI
分类号 G09F9/30;G02F1/1345;G02F1/1368;H01L21/336;H01L29/786;H01L51/50 主分类号 G09F9/30
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