发明名称 |
RESISTANCE CORRECTION CIRCUIT, RESISTANCE CORRECTION METHOD, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To suppress change in a resistance value caused by stress.SOLUTION: A resistance correction circuit comprises: a first resistive element whose relation between a stress and a resistance value is in a first relation; a second resistive element whose relation between a stress and a resistance value is in a second relation; and a correction part controlling a resistance value of a correction target resistive element. The correction part detects a difference between a resistance value r1 of the first resistive element and a resistance value r2 of the second resistive element, and corrects the resistance value of the correction target resistive element on the basis of the detection result. |
申请公布号 |
JP2014090139(A) |
申请公布日期 |
2014.05.15 |
申请号 |
JP20120240532 |
申请日期 |
2012.10.31 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
YAYAMA KOSUKE;NAKAMURA HOMARE |
分类号 |
H01L27/04;H01L21/822 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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