发明名称 SELF-ALIGNED CARBON NANOSTRUCTURE FIELD EFFECT TRANSISTORS USING SELECTIVE DIELECTRIC DEPOSITION
摘要 <p>Self-aligned carbon nanostructure field effect transistor structures are provided, which are formed using selective dielectric deposition techniques. For example, a transistor device includes an insulating substrate and a gate electrode embedded in the insulating substrate. A dielectric deposition-prohibiting layer is formed on a surface of the insulating substrate surrounding the gate electrode. A gate dielectric is selectively formed on the gate electrode. A channel structure (such as a carbon nanostructure) is disposed on the gate dielectric A passivation layer is selectively formed on the gate dielectric. Source and drain contacts are formed on opposing sides of the passivation layer in contact with the channel structure. The dielectric deposition-prohibiting layer prevents deposition of dielectric material on a surface of the insulating layer surrounding the gate electrode when selectively forming the gate dielectric and passivation layer.</p>
申请公布号 WO2014042754(A1) 申请公布日期 2014.03.20
申请号 WO2013US49215 申请日期 2013.07.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;FARMER, DAMON, B.;FRANKLIN, AARON, D.;HAN, SHU-JEN;TULEVSKI, GEORGE, S. 发明人 FARMER, DAMON, B.;FRANKLIN, AARON, D.;HAN, SHU-JEN;TULEVSKI, GEORGE, S.
分类号 H01L29/76 主分类号 H01L29/76
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