发明名称 |
APPARATUS FOR INSPECTION OF DIELECTRIC SUBSTANCE AND METHOD FOR INSPECTION OF DIELECTRIC SUBSTANCE |
摘要 |
An apparatus for inspecting a dielectric substance comprises: a light emitting unit which radiates light to a dielectric substance; a light amount measuring unit which measures the amount of light passing the dielectric substance; and a determining unit which determines the existence of a defect in the dielectric substance by comparing the measurement value of the light amount measuring unit with a previously set reference value. |
申请公布号 |
KR20140034571(A) |
申请公布日期 |
2014.03.20 |
申请号 |
KR20120101083 |
申请日期 |
2012.09.12 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
LEE, GEUN YOO;CHUN, SE KYUNG |
分类号 |
G01N21/88 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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