发明名称 APPARATUS FOR INSPECTION OF DIELECTRIC SUBSTANCE AND METHOD FOR INSPECTION OF DIELECTRIC SUBSTANCE
摘要 An apparatus for inspecting a dielectric substance comprises: a light emitting unit which radiates light to a dielectric substance; a light amount measuring unit which measures the amount of light passing the dielectric substance; and a determining unit which determines the existence of a defect in the dielectric substance by comparing the measurement value of the light amount measuring unit with a previously set reference value.
申请公布号 KR20140034571(A) 申请公布日期 2014.03.20
申请号 KR20120101083 申请日期 2012.09.12
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 LEE, GEUN YOO;CHUN, SE KYUNG
分类号 G01N21/88 主分类号 G01N21/88
代理机构 代理人
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