发明名称 Reed testing device for single-reed instrument
摘要 Objective index is indicated with respect to the characteristic comparison between the front and the back sides of the reed, the right and left balance, and the hardness characteristic compared to the reference reed. A holder guiding member 11 is disposed on a rotating table 2, and a holder 10 is detachably mounted on the holder guiding member 11. The holder 10 holds the test object reed R. Testing of the front and the back surfaces of the reed R is performed by turning the holder 10 upside down. A probe 20 is made contact with the surface of the reed R with the constant pressure force, and the deformation degree of the probe 20 is detected by a displacement sensor 30 with rotating the rotating table 2. The rigidity distribution of reed R in the width direction is obtained by the displacement sensor 30. The rigidity distribution characteristics of the front and the back sides are tested by displaying the front-side characteristic graph and the reversed back-side characteristic graph on one screen. The balance index is calculated from the areas resultantly generated by superimposing the front-and-back-side characteristic graphs with the reversed graphs thereof. The hardness index is obtained based on the integrating value of the front-and-back-side characteristics and the integrating value of the front-and-back-side characteristics of the reference reed.
申请公布号 US8666696(B2) 申请公布日期 2014.03.04
申请号 US201013000574 申请日期 2010.07.05
申请人 HANAI KHOI 发明人 HANAI KHOI
分类号 G01C9/00;G01C17/00;G01C19/00;G01N3/20;G10D9/02 主分类号 G01C9/00
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