发明名称 FABRICATION AND STRUCTURE OF ASYMMETRIC FIELD-EFFECT TRANSISTORS USING L-SHAPED SPACERS
摘要 A gate electrode (302) of a field-effect transistor (102) is defined above, and vertically separated by a gate dielectric layer (300) from, a channel-zone portion (284) of body material of a semiconductor body. Semiconductor dopant is introduced into the body material to define a more heavily doped pocket portion (290) using the gate electrode as a dopant-blocking shield. A spacer (304T) having a dielectric portion situated along the gate electrode, a dielectric portion situated along the body, and a filler portion (SC) largely occupying the space between the other two spacer portions is provided. Semiconductor dopant is introduced into the body to define a pair of source/drain portions (280M and 282M) using the gate electrode and spacer as a dopant-blocking shield. The filler spacer portion is removed to convert the spacer to an L shape (304). Electrical contacts (310 and 312) are formed respectively to the source/drain portions.
申请公布号 EP2412015(A4) 申请公布日期 2014.02.26
申请号 EP20100756492 申请日期 2010.03.25
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 PARKER, D., COURTNEY;ARCHER, DONALD, M.;BAHL, SANDEEP, R.;BULUCEA, CONSTANTIN;FRENCH, WILLIAM, D.;JOHNSON, PETER, B.;YANG, JENG-JIUN
分类号 H01L21/70;H01L21/336;H01L29/02;H01L29/10;H01L29/78 主分类号 H01L21/70
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