发明名称 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
摘要 In a plasma processing apparatus including a processing room disposed in a vacuum vessel, a sample stage located in the processing room, a dielectric film disposed on the top surface of the sample stage and serving as the sample mounting surface of the sample stage, and a plurality of electrodes embedded in the dielectric film for chucking the sample to the dielectric film when supplied with electric power, a part of the sample is chucked by supplying electric power to at least one of the electrodes while the sample is mounted on the sample stage; the sample is heated up to a predetermined temperature; a larger part of the sample is chucked by supplying electric power to the other of the electrodes; and the processing of the sample using the plasma is initiated.
申请公布号 US2014001154(A1) 申请公布日期 2014.01.02
申请号 US201213602421 申请日期 2012.09.04
申请人 SATO KOHEI;NAKAMOTO KAZUNORI;OMOTO YUTAKA;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SATO KOHEI;NAKAMOTO KAZUNORI;OMOTO YUTAKA
分类号 H01L21/3065;C23F1/00;C23F1/08 主分类号 H01L21/3065
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