发明名称 A FAST MICROSCOPE FOR MEASURING DYNAMIC OPTICAL SIGNALS
摘要 <p>In one embodiment, a method includes instructing a pattern generator to provide an excitation pattern to a sample under test, and controlling a movable mechanism that receives an emission pattern from the sample under test responsive to the excitation pattern. The controlling includes causing the movable mechanism to sweep a representation of the emission pattern along a path, thereby creating at least one streak, and synchronizing the motion of the movable mechanism with the frame rate of an imaging device, such that a full sweep of the representation of the emission pattern along the path corresponds to approximately one frame of the imaging device. The variable intensity of each streak represents a corresponding time varying intensity of a portion of the emission pattern. The varying intensity of a portion of the emission pattern may be captured with sub-millisecond resolution.</p>
申请公布号 WO2013184918(A1) 申请公布日期 2013.12.12
申请号 WO2013US44515 申请日期 2013.06.06
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 SHTRAHMAN, MATTHEW;AHARONI, DANIEL
分类号 G02B21/00;G01N21/64 主分类号 G02B21/00
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