发明名称 LASER ANNEAL DEVICE WITH PARTICLE COLLECTION MECHANISM
摘要 PROBLEM TO BE SOLVED: To collect particles evaporated from a laser irradiation part of a silicon substrate (B) immediately without requiring an ultraviolet laser light source.SOLUTION: A charge polarity sensor (1) for actually measuring the charge polarity of particles is provided, and a potential of reverse polarity from the actually measured charge polarity is applied to an electrode board (2). A large number of brush hairs (3) are stood from the electrode board (2). Furthermore, the air (P) near the surface of a silicon substrate (B) is sucked from a gas suction hole (4) of the electrode board (2) and discharged. Since UV-laser light is not radiated, particles are charged by an uncertain cause and the charge polarity cannot be known previously, but since the charge polarity is measured actually and a potential of reverse polarity is applied to the electrode board (2), particles can be collected immediately.
申请公布号 JP2013243245(A) 申请公布日期 2013.12.05
申请号 JP20120115306 申请日期 2012.05.21
申请人 JAPAN STEEL WORKS LTD:THE 发明人 KANAZAWA MASAHITO;MORITA SUSUMU
分类号 H01L21/268;H01L21/20 主分类号 H01L21/268
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