发明名称 |
EDDY CURRENT FLAW DETECTION TESTING DEVICE AND METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an eddy current flaw detection testing technique that allows elimination of influence of a lift-off and improvement of detection accuracy of defects.SOLUTION: An eddy current flaw detection testing device 10 includes a coil sensor 20 scanning a surface of an inspection object 11 with a first coil 21 and a second coil 22 which are coaxially provided. A sensitivity ratio R between a first signal sensitivity Sand a second signal sensitivity Sis calculated by using a first signal sensitivity Soutput by the first coil 21 to which a first induced magnetic field induced in the inspection object 11 is imparted and a second signal sensitivity Soutput by the second coil 22 to which the second induced magnetic field induced in the inspection object 11 is imparted. The correction of a lift-off of the first signal sensitivity Sis executed on the basis of the sensitivity ratio R and the second signal sensitivity S. |
申请公布号 |
JP2013224864(A) |
申请公布日期 |
2013.10.31 |
申请号 |
JP20120097011 |
申请日期 |
2012.04.20 |
申请人 |
TOSHIBA CORP |
发明人 |
UENO SOICHI;KOBAYASHI NORIYASU;KITAJIMA YUKO;MARUYAMA SHIGEKI;ICHIKAWA HIROYA |
分类号 |
G01N27/90 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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