发明名称 EDDY CURRENT FLAW DETECTION TESTING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an eddy current flaw detection testing technique that allows elimination of influence of a lift-off and improvement of detection accuracy of defects.SOLUTION: An eddy current flaw detection testing device 10 includes a coil sensor 20 scanning a surface of an inspection object 11 with a first coil 21 and a second coil 22 which are coaxially provided. A sensitivity ratio R between a first signal sensitivity Sand a second signal sensitivity Sis calculated by using a first signal sensitivity Soutput by the first coil 21 to which a first induced magnetic field induced in the inspection object 11 is imparted and a second signal sensitivity Soutput by the second coil 22 to which the second induced magnetic field induced in the inspection object 11 is imparted. The correction of a lift-off of the first signal sensitivity Sis executed on the basis of the sensitivity ratio R and the second signal sensitivity S.
申请公布号 JP2013224864(A) 申请公布日期 2013.10.31
申请号 JP20120097011 申请日期 2012.04.20
申请人 TOSHIBA CORP 发明人 UENO SOICHI;KOBAYASHI NORIYASU;KITAJIMA YUKO;MARUYAMA SHIGEKI;ICHIKAWA HIROYA
分类号 G01N27/90 主分类号 G01N27/90
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