MEASUREMENT METHOD FOR DENSITY OF CONDUCTIVE THIN FILM AND MEASUREMENT DEVICE THEREFOR

摘要

PURPOSE: A method and a device for measuring the density of a conductive thin film are provided to prevent the conductive thin film from being broken into small pieces by the weight caused by gravity. CONSTITUTION: A method for measuring the density of a conductive thin film (20) includes the following steps of: printing the conductive thin film on a substrate (10); plasticizing the substrate in which the conductive thin film is printed; measuring the weight of the plasticized substrate and the conductive thin film when both are in the air and dipped in solution respectively; removing the conductive thin film from the substrate; measuring the weight of the substrate in which the conductive thin film is removed when the substrate is in the air and dipped in solution respectively; subtracting the weight of the substrate in which the conductive thin film is removed from the weight of the substrate in which the conductive thin film is printed and calculating the conductive thin film when the conductive thin film is in the air or dipped in solution; and calculating the density of the conductive thin film based on the calculated weight.